Publications by Ken Mai

@inproceedings{abc,
	author = {Yu Cai and Saugata Ghose and Yixin Luo and Ken Mai and Onur Mutlu and Erich F. Haratsch},
	booktitle = {2017 IEEE International Symposium on High Performance Computer Architecture, HPCA 2017, Austin, TX, USA},
	title = {Vulnerabilities in MLC NAND Flash Memory Programming: Experimental Analysis, Exploits, and Mitigation Techniques.},
	url = {https://doi.org/10.1109/HPCA.2017.61},
	year = {2017}
}

@inproceedings{abc,
	author = {Yu Cai and Ken Mai and Onur Mutlu},
	booktitle = {Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA},
	title = {Comparative evaluation of FPGA and ASIC implementations of bufferless and buffered routing algorithms for on-chip networks.},
	url = {http://dx.doi.org/10.1109/ISQED.2015.7085472},
	year = {2015}
}

@inproceedings{abc,
	author = {Yu Cai and Yixin Luo and Erich F. Haratsch and Ken Mai and Onur Mutlu},
	booktitle = {21st IEEE International Symposium on High Performance Computer Architecture, HPCA 2015, Burlingame, CA, USA},
	title = {Data retention in MLC NAND flash memory: Characterization, optimization, and recovery.},
	url = {http://dx.doi.org/10.1109/HPCA.2015.7056062},
	year = {2015}
}

@inproceedings{abc,
	author = {Yu Cai and Gulay Yalcin and Onur Mutlu and Erich F. Haratsch and Osman S. Unsal and Adri{\'a}n Cristal and Ken Mai},
	booktitle = {ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS {\textquoteright}14, Austin, TX},
	title = {Neighbor-cell assisted error correction for MLC NAND flash memories.},
	url = {http://doi.acm.org/10.1145/2591971.2591994},
	year = {2014}
}

@inproceedings{abc,
	author = {Yu Cai and Onur Mutlu and Erich F. Haratsch and Ken Mai},
	booktitle = {2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA},
	title = {Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation.},
	url = {http://dx.doi.org/10.1109/ICCD.2013.6657034},
	year = {2013}
}

@inproceedings{abc,
	author = {Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai},
	booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France},
	title = {Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling.},
	year = {2013}
}

@inproceedings{abc,
	author = {Yu Cai and Gulay Yalcin and Onur Mutlu and Erich F. Haratsch and Adri{\'a}n Cristal and Osman S. Unsal and Ken Mai},
	booktitle = {30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada},
	title = {Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime.},
	url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2012.6378623},
	year = {2012}
}

@inproceedings{abc,
	author = {Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai},
	booktitle = {2012 Design, Automation  Test in Europe Conference  Exhibition, DATE 2012, Dresden, Germany},
	title = {Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.},
	url = {http://dx.doi.org/10.1109/DATE.2012.6176524},
	year = {2012}
}