Publication

2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 2012
@inproceedings{abc,
	author = {Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai},
	booktitle = {2012 Design, Automation  Test in Europe Conference  Exhibition, DATE 2012, Dresden, Germany},
	title = {Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.},
	url = {http://dx.doi.org/10.1109/DATE.2012.6176524},
	year = {2012}
}