Publication
2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 2012
@inproceedings{abc, author = {Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai}, booktitle = {2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany}, title = {Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.}, url = {http://dx.doi.org/10.1109/DATE.2012.6176524}, year = {2012} }