Publication
Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 2013
@inproceedings{abc, author = {Yu Cai and Erich F. Haratsch and Onur Mutlu and Ken Mai}, booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France}, title = {Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling.}, year = {2013} }