Publication

Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 2017
@inproceedings{abc,
	author = {Donghyuk Lee and Samira Manabi Khan and Lavanya Subramanian and Saugata Ghose and Rachata Ausavarungnirun and Gennady Pekhimenko and Vivek Seshadri and Onur Mutlu},
	booktitle = {Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA},
	title = {Design-Induced Latency Variation in Modern DRAM Chips: Characterization, Analysis, and Latency Reduction Mechanisms.},
	url = {http://doi.acm.org/10.1145/3078505.3078533},
	year = {2017}
}