Publication

Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance.
Yixin Luo, Sriram Govindan, Bikash Sharma, Mark Santaniello, Justin Meza, Aman Kansal, Jie Liu, Badriddine M. Khessib, Kushagra Vaid, and Onur Mutlu
CoRR, January 2016
@article{abc,
	author = {Yixin Luo and Sriram Govindan and Bikash Sharma and Mark Santaniello and Justin Meza and Aman Kansal and Jie Liu and Badriddine M. Khessib and Kushagra Vaid and Onur Mutlu},
	journal = {CoRR},
	title = {Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance.},
	url = {http://arxiv.org/abs/1602.00729},
	year = {2016}
}