Publication
45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2015, Rio de Janeiro, Brazil, June 2015
@inproceedings{abc,
author = {Yu Cai and Yixin Luo and Saugata Ghose and Onur Mutlu},
booktitle = {45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2015, Rio de Janeiro, Brazil},
title = {Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery.},
url = {http://dx.doi.org/10.1109/DSN.2015.49},
year = {2015}
}